Dental Materials
Volume 26, Issue 4 , Pages 295-305, April 2010

Surface characterization of zirconia dental implants

  • S. Zinelis

      Affiliations

    • Department of Biomaterials, University of Athens, Greece
    • ,
  • A. Thomas

      Affiliations

    • School of Physics and Astronomy, Photon Science Institute, University of Manchester, UK
    • ,
  • K. Syres

      Affiliations

    • School of Physics and Astronomy, Photon Science Institute, University of Manchester, UK
    • ,
  • N. Silikas

      Affiliations

    • Biomaterials Unit, University of Manchester, UK
    • ,
  • G. Eliades

      Affiliations

    • Department of Biomaterials, University of Athens, Greece
    • Corresponding Author InformationCorresponding author at: Department of Biomaterials, University of Athens, School of Dentistry, 2 Thivon Str-Goudi, 115 27 Athens, Greece. Tel.: +30 210 7461101; fax: +30 210 7461306.

Received 27 May 2009; received in revised form 27 September 2009; accepted 17 November 2009.

Abstract 

Objectives

The aim of the study was to characterize the chemical composition, microstructure and roughness of two commercially available zirconia dental implants (WhiteSky and Zit-Z).

Methods

The chemical composition of the cervical collar and threaded root parts of the implants (n=2) were studied by XPS and HV-EDX. LV-SEM was used for morphological assessment, Raman microanalysis for microstructural characterization and optical profilometry for surface roughness measurements. XRD, HV-EDX and Raman microanalysis of bulk regions (longitudinal sections) were used as reference.

Results

XPS showed the presence of C, O, Zr and Y (collar) plus Al (root) at implant surfaces. More C (10–26at%) and a lower Al/Zr ratio were found in WhiteSky (1.05 vs 1.26 in Zit-Z). Zr, Y and Al were detected in single, fully oxidized states. The same elements, plus Hf, were identified by HV-EDX at bulk and surface regions, with a Al/Zr ratio higher in WhiteSky (0.17 vs 0.09 in Zit-Z). Na, K and Cl contaminants were traced at implant root parts by both methods. XRD analysis of cross-sectioned specimens revealed the presence of monoclinic and tetragonal zirconia along with cubic yttria phases. Raman microanalysis showed that the monoclinic zirconia volume fraction was higher at root surfaces than the collar. No monoclinic phase was found at bulk regions. Significantly higher Sa and Sq values were recorded in WhiteSky than Zit-Z, whereas Zit-Z showed higher Rt value.

Significance

The differences found between the implants in the extent of carbon contamination, residual alumina content, tetragonal to monoclinic ZrO2 phase transformation and 3D-roughness parameters may contribute to a substantial differentiation in the cellular and tissue response.

Keywords: Zirconia dental implants, Surface analysis, XPS, Raman microanalysis, SEM/EDX, Optical profilometry

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PII: S0109-5641(09)00424-2

doi:10.1016/j.dental.2009.11.079

Dental Materials
Volume 26, Issue 4 , Pages 295-305, April 2010

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