Relationship between microtensile bond strength and submicron hiatus at the composite–dentin interface using CLSM visualization technique

Ding, Paul G.F.; Matzer, Axel R.A.H.; Wolff, Diana; Mente, Johannes; Pioch, Thomas; Staehle, Hans Jörg; Dannewitz, Bettina

doi:10.1016/j.dental.2009.11.003

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Volume 26, Issue 3 , Pages 257-263, March 2010

Relationship between microtensile bond strength and submicron hiatus at the composite–dentin interface using CLSM visualization technique

Paul G.F. Ding
- Department of Conservative Dentistry, Clinic for Oral, Dental and Maxillofacial Diseases, University Hospital Heidelberg, Germany
- Corresponding author at: Poliklinik für Zahnerhaltungskunde, Im Neuenheimer Feld 400, D-69120 Heidelberg, Germany. Tel.: +49 6221 56 38589; fax: +49 6221 56 5074.
Axel R.A.H. Matzer
- Department of Conservative Dentistry, Clinic for Oral, Dental and Maxillofacial Diseases, University Hospital Heidelberg, Germany
Diana Wolff
- Department of Conservative Dentistry, Clinic for Oral, Dental and Maxillofacial Diseases, University Hospital Heidelberg, Germany
Johannes Mente
- Department of Conservative Dentistry, Clinic for Oral, Dental and Maxillofacial Diseases, University Hospital Heidelberg, Germany
Thomas Pioch
- Department of Conservative Dentistry, Clinic for Oral, Dental and Maxillofacial Diseases, University Hospital Heidelberg, Germany
Hans Jörg Staehle
- Department of Conservative Dentistry, Clinic for Oral, Dental and Maxillofacial Diseases, University Hospital Heidelberg, Germany
Bettina Dannewitz
- Department of Conservative Dentistry, Clinic for Oral, Dental and Maxillofacial Diseases, University Hospital Heidelberg, Germany
- Department of Periodontology, Center for Dental, Oral and Maxillofacial Medicine, University Hospital Frankfurt, Germany

Received 19 February 2009; received in revised form 15 May 2009; accepted 5 November 2009.

Abstract

Objectives

“Submicron hiatus” represents a potential space between the base of the collagenous network and the mineralized dentin when it is acid etched for bonding. This study evaluated the relationship between microtensile bond strength (μTBS) and occurrence of submicron hiatus formations at the resin–dentin interface using the same specimens.

Methods

Resin–dentin bonded micro-specimens (sticks with a size of 300μm×300μm×8mm) were prepared using one of two material combinations (group I: Syntac Classic/Tetric Ceram Cavifil: n=51 group II: Prime & Bond NT/Tetric Ceram Cavifil: n=56). After labeling the primer component with a tiny amount of rhodamine-B-isothiocyanate, submicron hiatus formations were imaged nondestructively using a confocal laser scanning microscope (CLSM). Subsequently specimens were subjected to a μTBS test.

Results

For the influence of submicron hiatus formations on μTBS with the Syntac Classic group, the nonparametric Spearman's correlation was −0.329 at p=0.02. For the Prime & Bond NT group, the nonparametric Spearman's correlation was −0.356 at p=0.007. Analyzing the effect of submicron hiatus on without discriminating by group resulted in a Spearman's correlation coefficient of −0.341 at p=0.001; μTBS and quality of hybrid layer showed a correlation coefficient of 0.849 at p=0.001, and μTBS and quality of tag formation showed a correlation coefficient of 0.474 at p=0.001.